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General Information
    • ISSN: 2010-3689
    • Frequency: Bimonthly (2011-2014); Monthly (Since 2015)
    • DOI: 10.18178/IJIET
    • Editor-in-Chief: Prof. Dr. Steve Thatcher
    • Executive Editor: Ms. Nancy Y. Liu
    • Abstracting/ Indexing: EI (INSPEC, IET), Electronic Journals Library, Google Scholar, Crossref and ProQuest
    • E-mail: ijiet@ejournal.net
Prof. Dr. Steve Thatcher
QUniversity, Australia
It is my honor to be the editor-in-chief of IJIET. The journal publishes good-quality papers which focous on the advanced researches in the field of information and education technology. Hopefully, IJIET will become a recognized journal among the scholars in the related fields.

IJIET 2012 Vol.2(5): 448-450 ISSN: 2010-3689
DOI: 10.7763/IJIET.2012.V2.175

Evaluation of Requirement Defects: An Implementation of Identification Technique

Sandeep Kumar Nayak, Raees Ahmad Khan, and Mohd. Rizwan Beg

Abstract—There are various techniques involved in identification of defects in developing software but could not find a successful identification process in early stages. A concrete and cost effective technique for defect identification in early stage is high indispensable in modern era of software application and implications. In this study, we are attentive over an effort to commence an appropriate defect identification technique having two major components i.e. Requirement Inspection Participants (RIP) and Requirement Inspection Method (RIM). Although RIP is executed through author, moderator, reader, inspector and recorder, but RIM is covered through plan development, outline design, preparation and reporting to deliver overall requirement defect. After mutual course of action in identification, the inspection technique may be competent to deliver a significant output in the form of requirement defect. The implementation of defect inspection technique would also be appreciated by industry, software developers and innovators in future.

Index Terms—Requirement inspection technique, requirement inspection method, defect identification, requirement defect.

Sandeep Kumar is with Dept. of Computer Science & Application, Integral University, Lucknow-UP, India (nayak_sam@rediffmail.com).
Raees Ahmad Khan is with Dept. of Information Technology, Babasaheb Bhimrao Ambedkar University (A Central University), Lucknow-UP, India.
Mohd. Rizwan Beg is with Dept. of Computer Science & Engineering, Integral University, Lucknow-UP, India.


Cite: Sandeep Kumar Nayak, Raees Ahmad Khan, and Mohd. Rizwan Beg, "Evaluation of Requirement Defects: An Implementation of Identification Technique," International Journal of Information and Education Technology vol. 2, no. 5, pp. 448-450, 2012.

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