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General Information
    • ISSN: 2010-3689
    • Frequency: Bimonthly (2011-2014); Monthly (Since 2015)
    • DOI: 10.18178/IJIET
    • Editor-in-Chief: Prof. Dr. Steve Thatcher
    • Executive Editor: Ms. Nancy Y. Liu
    • Abstracting/ Indexing: EI (INSPEC, IET), Electronic Journals Library, Google Scholar, Crossref and ProQuest
    • E-mail: ijiet@ejournal.net
Editor-in-chief
Prof. Dr. Steve Thatcher
University of South Australia, Australia
It is my honor to be the editor-in-chief of IJIET. The journal publishes good papers which focous on the advanced researches in the field of information and education technology. Hopefully, IJIET will become a recognized journal among the scholars in the filed of information and education technology.
IJIET 2017 Vol.7(7): 525-528 ISSN: 2010-3689
doi: 10.18178/ijiet.2017.7.7.923

Investigating Central Tendency in Competency Assessment of Design Electronic Circuit: Analysis Using Many Facet Rasch Measurement (MFRM)

Azmanirah Ab Rahman, Jamil Ahmad, Ruhizan Mohammad Yasin, and Nurfirdawati Muhamad Hanafi
Abstract—Rater plays an important role in awarding fair judgment to students. However, the difficulty to consider fairness to the student applies, especially for the assessment of competency in design electronic circuit. Therefore, the use of an analytic scoring rubric as a guide can reduce the error due to the nature of rubrics. This present research employs Many Facet Rasch Measurement (MFRM) to explore rater error focusing on central tendency effect. Participants comprised of a sample of nine experienced teachers who were employed to assess 68 students in their competency of Electronic Circuit Design process in Vocational College in Malaysia. Students were observed using four-point analytic rating scale. The data were collected and analyzed using FACET, a MFRM computer software program. The results were presented in two ways: at the group level and at the individual level. At the group level, information from the scale category statistics indicated central tendency effect; however, none of the separation statistics indicated such an effect. At the individual level, there are two raters that exhibit centrality.

Index Terms—Central tendency, many facet Rasch measurement (MFRM).

Azmanirah Ab Rahman and Nurfirdawati Muhamad Hanafi are with Universiti Tun Hussein Onn Malaysia, 86400 Parit Raja Batu Pahat Johor, Malaysia (e-mail: azmanira@uthmedu.my, nurfirda@uthmedu.my).
Jamil Ahmad and Ruhizan Mohammad Yasin are with Universiti Kebangsaan Malaysia, 43650 Bangi Selangor Darul Ehsan, Malaysia (e-mail: jamil3191@yahoo.com, ruhizan@ukm.my).

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Cite: Azmanirah Ab Rahman, Jamil Ahmad, Ruhizan Mohammad Yasin, and Nurfirdawati Muhamad Hanafi, "Investigating Central Tendency in Competency Assessment of Design Electronic Circuit: Analysis Using Many Facet Rasch Measurement (MFRM)," International Journal of Information and Education Technology vol. 7, no. 7, pp. 525-528, 2017.

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