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IJIET 2015 Vol.5(10): 763-767 ISSN: 2010-3689
DOI: 10.7763/IJIET.2015.V5.607

An Efficient Approach for Model Based Test Path Generation

Aye Aye Kyaw and Myat Myat Min

Abstract—Software testing plays a vital role in developing software that is freedom from bugs and defects. Manual test is a cost and time consuming process although it may find many defects in a software application. If the testing process could be automated, the cost of developing software could be reduced obviously. The most critical part of the testing process is generation of test cases. Model based test path generation approaches identify faults in the implementation at early design phase, reduce the software development time, and inspire developer to improve design quality. The proposed approach focuses on Model Based testing for automatic best test path generation. In this approach, the proposed system generates all possible test paths and optimizes a test path from these paths. The proposed system will reduce the processing time by using XMI based activity diagram, validate the generated test paths with Cyclomatic Complexity and choose the best test path without dependence on others.

Index Terms—Model-based testing, test path, test path generation, UML activity diagram.

The authors are with the University of Computer Studies, Mandalay, Myanmar (e-mail: ayeayekyaw2009@gmail.com, myatiimin@gmail.com).


Cite: Aye Aye Kyaw and Myat Myat Min, "An Efficient Approach for Model Based Test Path Generation," International Journal of Information and Education Technology vol. 5, no. 10, pp. 763-767, 2015.

General Information

  • ISSN: 2010-3689 (Online)
  • Abbreviated Title: Int. J. Inf. Educ. Technol.
  • Frequency: Monthly
  • DOI: 10.18178/IJIET
  • Editor-in-Chief: Prof. Jon-Chao Hong
  • Managing Editor: Ms. Nancy Y. Liu
  • Abstracting/ Indexing: Scopus (CiteScore 2023: 2.8), INSPEC (IET), UGC-CARE List (India), CNKI, EBSCO, Google Scholar
  • E-mail: ijiet@ejournal.net


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