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IJIET 2016 Vol.6(1): 50-53 ISSN: 2010-3689
DOI: 10.7763/IJIET.2016.V6.657

Enhancement of Image Sharpness with Bilateral and Adaptive Filter

Ch. Ravi Kumar and S. K. Srivatsa

Abstract—The two most common forms of degradation, an image suffers are loss of sharpness or blur, and noise. In this paper, an attempt has been made to first develop a sharpening method that increases the slope of edges without producing overshoot and undershoot, which renders clean, crisp, and artifact-free edges, thereby improving the overall appearance of the image. In this paper, we present the adaptive bilateral filter (ABF) for sharpness enhancement and noise removal. The ABF sharpens an image by increasing the slope of the edges without producing overshoot or undershoot. It is an approach to sharpness enhancement that is fundamentally different from the un sharp mask. This new approach to slope restoration also differs previous slope restoration algorithms. In the ABF, the edge slope is enhanced by transforming the histogram via a range filter with adaptive offset and width. The ABF is able to smooth the noise, while enhancing edges and textures in the image. The parameters of the ABF are optimized with a training procedure.. The proposed method is effective at removing signal noise while enhancing the experimental results in perceptual quality both quantitatively and qualitatively.

Index Terms—Bilateral filter, de-blurring, noise removal, range filter, sharpness.

Ch. Ravi Kumar is with Prakasam Engineering College, Kandukur, Prakasam (Dt) Andhra Pradesh, India (e-mail: ravi_ece99@yahoo.com).
S. K. Srivatsa is with the Department of ECE, Anna University, Chennai, India (e-mail: profsks@rediffmail.com).


Cite: Ch. Ravi Kumar and S. K. Srivatsa, "Enhancement of Image Sharpness with Bilateral and Adaptive Filter," International Journal of Information and Education Technology vol. 6, no. 1, pp. 50-53, 2016.

General Information

  • ISSN: 2010-3689 (Online)
  • Abbreviated Title: Int. J. Inf. Educ. Technol.
  • Frequency: Monthly
  • DOI: 10.18178/IJIET
  • Editor-in-Chief: Prof. Dr. Steve Thatcher
  • Executive Editor: Ms. Nancy Y. Liu
  • Abstracting/ Indexing: Scopus (CiteScore 2022: 2.0), INSPEC (IET), UGC-CARE List (India), CNKI, EBSCO, Google Scholar
  • E-mail: ijiet@ejournal.net


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