IJIET 2020 Vol.10(2): 117-121 ISSN: 2010-3689
doi: 10.18178/ijiet.2020.10.2.1349

Implementing DDD for Automatic Test Case Generation

Wacharapong Nachiengmai, Sakgasit Ramingwong, and Amphol Kongkeaw

Abstract—Software testing is a necessary process to ensure quality of software. Unfortunately, it is usually perceived as a very difficult process for inexperienced software developers. Defect-driven Development (DDD) is a novel development concept which aims to bridge such gap. DDD helps inexperienced developers to automatically generate essential test cases and scripts from defect information collected from a knowledge base. This research describes an implementation of the concept as well as its performance evaluation. The result suggests that this technique helps beginners to create an equivalent effectiveness level of unit test compared to experts in both term of time used and defect density.

Index Terms—Software testing, defect-driven development, automatic test case generation.

Wacharapong Nachiengmai is with the Department of Business Computer, Faculty of Business Administration, North – Chiangmai University, Chiang Mai, Thailand (e-mail: wacharapong@northcm.ac.th).
Sakgasit Ramingwong is with the Department of Computer Engineering, Faculty of Engineering, Chiang Mai University, Chiang Mai, Thailand (e-mail: sakgasit@eng.cmu.ac.th).
Amphol Kongkeaw is with the Department of Software Engineering, Faculty of Engineering and Technology, North – Chiang Mai University, Chiang Mai, Thailand (e-mail: amphol@northcm.ac.th).

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Cite: Wacharapong Nachiengmai, Sakgasit Ramingwong, and Amphol Kongkeaw, "Implementing DDD for Automatic Test Case Generation," International Journal of Information and Education Technology vol. 10, no. 2, pp. 117-121, 2020.

Copyright © 2020 by the authors. This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited (CC BY 4.0).

General Information

  • ISSN: 2010-3689 (Online)
  • Abbreviated Title: Int. J. Inf. Educ. Technol.
  • Frequency: Monthly
  • DOI: 10.18178/IJIET
  • Editor-in-Chief: Prof. Dr. Steve Thatcher
  • Executive Editor: Ms. Nancy Y. Liu
  • Abstracting/ Indexing: Scopus (Since 2019), EI(INSPEC, IET), EBSCO, Electronic Journals Library, Google Scholar, Crossref, etc.
  • E-mail: ijiet@ejournal.net